Browse by Subject Semiconductor device measurement

Showing results 1 to 6 of 6

1
785-nm Frequency Comb-Based Time-of-Flight Detection for 3D Surface Profilometry of Silicon Devices

Kwak, Hyunsoo; Ahn, Changmin; Na, Yongjin; Bae, Jinho; Kim, Jungwon, IEEE PHOTONICS JOURNAL, v.14, no.5, 2022-10

2
A 24-GHz CMOS Power Amplifier With Dynamic Feedback and Adaptive Bias Controls

Jin, Yoonsoo; Hong, Songcheol, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.31, no.2, pp.153 - 156, 2021-02

3
A 28-GHz CMOS Power Amplifier Linearized by Dynamic Conductance Control and Body Carrier Injection

Lee, Wonho; Yoo, Jongho; Hong, Songcheol, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.31, no.9, pp.1071 - 1074, 2021-09

4
A V-Band Differential Push-Push Frequency Doubler With a Current-Reuse gm-Boosted Buffer

So, Cheol; Hong, Songcheol, IEEE MICROWAVE AND WIRELESS TECHNOLOGY LETTERS, v.33, no.3, pp.299 - 302, 2023-03

5
Fast Optical Proximity Correction Using Graph Convolutional Network With Autoencoders

Cho, Gangmin; Kim, Taeyoung; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.4, pp.629 - 635, 2023-11

6
Integrated Test Pattern Extraction and Generation for Accurate Lithography Modeling

Cho, Gangmin; Kwon, Yonghwi; Kareem, Pervaiz; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.35, no.3, pp.495 - 503, 2022-08

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