Browse by Type Article
Showing results 31621 to 31640 of 100119
| ELECTROMAGNETIC-WAVE AMPLIFICATION OF CYCLOTRON CHERENKOV MASER CHO, YH; Choi, Duk In; CHOI, JS, OPTICS COMMUNICATIONS, v.94, no.6, pp.530 - 536, 1992-12 |
| Electromagnetically induced absorption spectra depending on intensities and detunings of the coupling field in Cs vapour m. kwon; h.d. park; h.s. moon; h.s. rawat; k. an; j.b. kim; Kim, Kyoungdae, JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, v.34, no.23, pp.4801 - 4808, 2001-11 |
| Electromagneto-thermo-mechanical behaviors of conductive circular plate subject to time-dependent magnetic fields Gao, Yuanwen; Xu, B; Huh, Hoon, ACTA MECHANICA, v.210, no.1-2, pp.99 - 116, 2010-02 |
| Electromechanical diagnostic method for monitoring cracks in polymer electrolyte fuel cell electrodes Jang, Kyung-Lim; Kim, Sanwi; Jeong, Byeong-Heon; Oh, Jong-Gil; Hong, Bo Ki; Kim, Taek-Soo, INTERNATIONAL JOURNAL OF HYDROGEN ENERGY, v.42, no.16, pp.11644 - 11653, 2017-04 |
| Electromechanical Enhancement of Metal Nanoparticle Thin Film by Composite Formation with Short Metal Nanowires Kim, Sanghyeok; Lee, Jaemin; Park, Jaeho; Lee, Jung-Yong; Kim, Jae-Hyun; Park, Inkyu, Functional Composites and Structures, v.1, no.3, 2019-09 |
| Electromechanical impedance measurement from large structures using a dual piezoelectric transducer Sonh, Homin; Lim, Hyung Jin; Sohn, Hoon, JOURNAL OF SOUND AND VIBRATION, v.332, no.25, pp.6580 - 6595, 2013-12 |
| Electromechanical impedance method of fiber-reinforced plastic adhesive joints in corrosive environment using a reusable piezoelectric device Na, Sam; Tawie, Rudy; Lee, Haeng-Ki, JOURNAL OF INTELLIGENT MATERIAL SYSTEMS AND STRUCTURES, v.23, no.7, pp.737 - 747, 2012-05 |
| Electromechanical method coupling non-invasive skin impedance probing and in vivo subcutaneous liquid microinjection: controlling the diffusion pattern of nanoparticles within living soft tissues Sung, Baeckkyoung; Kim, Se Hoon; Lee, Jin-Kyu; Lee, Byung Cheon; Soh, KS, BIOMEDICAL MICRODEVICES, v.16, no.4, pp.645 - 653, 2014-08 |
| Electromigration in flip chip solder bump of 97Pb-3Sn/37Pb-63Sn combination structure Nah, JW; Kim, JH; Lee, HyuckMo; Paik, Kyung-Wook, ACTA MATERIALIA, v.52, no.1, pp.129 - 136, 2004-01 |
| Electromigration induced Kirkendall void growth in Sn-3.5Ag/Cu solder joints Jung, Yong; Yu, Jin, JOURNAL OF APPLIED PHYSICS, v.115, no.8, 2014-02 |
| Electromigration model for the prediction of lifetime based on the failure unit statistics in aluminum metallization Park, JH; Ahn, Byung Tae, JOURNAL OF APPLIED PHYSICS, v.93, no.2, pp.883 - 892, 2003-01 |
| Electromigration Performance of Pb-free Solder Joints in Terms of Solder Composition and Joining Path Seo, Sun-Kyoung; Kang, Sung K.; Cho, Moon Gi; Lee, HyuckMo, JOM, v.62, no.7, pp.22 - 29, 2010-07 |
| Electromigration Reliability of Barrierless Ruthenium and Molybdenum for Sub-10 nm Interconnection Kim, Jungkyun; Rhee, Hakseung; Son, Myeong Won; Park, Juseong; Kim, Gwangmin; Song, Hanchan; Kim, Geunwoo; et al, ACS APPLIED ELECTRONIC MATERIALS, v.5, no.5, pp.2447 - 2453, 2023-04 |
| Electron and composite-fermion edge states in nonuniform magnetic fields Sim, Heung-Sun; Chang, Kee-Joo; Kim, N; Ihm, G, PHYSICAL REVIEW B, v.63, no.12, pp.125329 - 125329, 2001-03 |
| ELECTRON AND ION ENERGIES IN PLASMAS GENERATED BY THE ELECTRON-CYCLOTRON-RESONANCE MECHANISM UHM, HS; Chang, Hong-Young; KIM, JH; SONG, SK, PHYSICS OF PLASMAS, v.2, no.3, pp.991 - 1001, 1995-03 |
| Electron and ion kinetics in magnetized capacitively coupled plasma source Lee, SH; You, SJ; Chang, Hong-Young; Lee, JK, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v.25, pp.455 - 463, 2007-05 |
| ELECTRON AND X-RAY DIFFRACTION STUDY OF La AND Li MODIFIED INCOMMENSURATE STRONTIUM BARIUM NIOBATE Chun, Myoung Pyo; Kim, Hyo Jin; Choo, Woong Kil, FERROELECTRICS, v.155, pp.227 - 232, 1994 |
| Electron backscatter diffraction analysis of dynamically recrystallized grain structures in a Ni-Cr-Fe base alloy Na, YS; Yeom, JT; Park, NK; Lee, Jai Young, METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, v.37A, no.1, pp.41 - 47, 2006-01 |
| Electron beam damage in the SiN membrane of an X-ray lithography mask Choi, Sang-Soo; Kim, Jong Soo; Chung, Hai Bin; Yoo, Hyung Joun; Kim, Bo-Woo, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.37, no.1, pp.360 - 363, 1998-01 |
| Electron beam induced degradation of CaS : Pb thin film phosphor grown by atomic layer deposition Yun, SJ; Park, SHK; Park, JB, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.6, no.2, pp.30 - 32, 2003-02 |
Discover
Type
Open Access
Date issued
- 31,154 2020 - 2024
- 99,968 2010 - 2019
- 75,670 2000 - 2009
- 44,727 1990 - 1999
- 14,360 1980 - 1989
- 62 1964 - 1969